Design for a high resolution electron energy loss microscope
نویسندگان
چکیده
منابع مشابه
A design for a subminiature, low energy scanning electron microscope with atomic resolution
The University Repository is a digital collection of the research output of the University, available on Open Access. Copyright and Moral Rights for the items on this site are retained by the individual author and/or other copyright owners. Users may access full items free of charge; copies of full text items generally can be reproduced, displayed or performed and given to third parties in any ...
متن کاملHigh-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy.
An all-magnetic monochromator/spectrometer system for sub-30 meV energy-resolution electron energy-loss spectroscopy in the scanning transmission electron microscope is described. It will link the energy being selected by the monochromator to the energy being analysed by the spectrometer, without resorting to decelerating the electron beam. This will allow it to attain spectral energy stability...
متن کاملData processing for atomic resolution electron energy loss spectroscopy.
The high beam current and subangstrom resolution of aberration-corrected scanning transmission electron microscopes has enabled electron energy loss spectroscopy (EELS) mapping with atomic resolution. These spectral maps are often dose limited and spatially oversampled, leading to low counts/channel and are thus highly sensitive to errors in background estimation. However, by taking advantage o...
متن کاملResolution in Electron Microscope Radioautography
Experimental resolution values, half distances (HD), were determined for electron microscope radioautography with (14)C as the source of radioactivity. These were about a factor of 1.5-2 times higher than for tritium. Grain distributions normalized in units of HD were found to fit the "universal" curves previously obtained for tritium.
متن کاملThe phonon contribution to high-resolution electron microscope images.
The amount of phonon scattering as a function of specimen thickness is determined for a clean silicon sample, free from amorphous surface layers, by measuring the diffuse scattering in energy-filtered convergent-beam diffraction patterns. It is found that for a 25 nm thick sample, only 7.5% of the intensity scattered to less than 18 nm(-1) is phonon scattered. This means that in a typical high-...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 2019
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2019.112848